Trace Impurity Review Table
Semiconductor programs should define restricted elements before sample production. The table helps procurement and process teams turn purity expectations into a measurable qualification file.
| Element | Typical Limit | Why Controlled |
|---|---|---|
| Total ash | <5-10 ppm class by buyer acceptance plan where specified | Ash content is a direct qualification item for SiC crystal-growth consumables. |
| Fe / Ni / Cr | Restricted by buyer trace-metal table | Transition metals are commonly controlled to reduce crystal contamination and defect risk. |
| B / V / Ti | Defined by SiC growth sensitivity | Relevant for dopant background, micropipe risk review, and buyer-side traceability files. |
| Na / Ca / Mg | Project-specific limit or report-only scope by process need | Alkali and alkaline-earth elements can be included in buyer COA templates for clean hot-zone parts. |








