Trace Impurity Review Table
Semiconductor programs should define restricted elements before sample production. The table helps procurement and process teams turn purity expectations into a measurable qualification file.
| Element | Typical Limit | Why Controlled |
|---|---|---|
| Fe / Cr / Ni | Buyer-defined trace-metal limits | Contact and vapor-facing parts need restricted metallic background before qualification. |
| Al / Ca / Na | Project-specific acceptance boundary | Common elements to define for high-purity graphite substrate and post-coating handling. |
| B / V / Ti | Defined by SiC / AlN process sensitivity | Relevant when buyers evaluate dopant background, contamination, or crystal defect risk. |
| Ta | Reported as TaC coating element where required | Useful for buyer-side records separating intended coating chemistry from contamination limits. |





