Trace Impurity Review Table
Semiconductor programs should define restricted elements before sample production. The table helps procurement and process teams turn purity expectations into a measurable qualification file.
| Element | Typical Limit | Why Controlled |
|---|---|---|
| Na / K | Buyer-defined ppm or ppb target | Alkali metals can contaminate high-value epitaxy and wafer-contact processes. |
| Al / Fe | Buyer-defined trace-metal limits | Common metallic contaminants that should be bounded before qualification samples. |
| Cr / Ni | Restricted where corrosion or alloy contamination matters | Transition metals can affect sensitive semiconductor process acceptance. |
| V / Ti | Project-specific limits for SiC and power-device programs | Often reviewed when substrate purity and coating purity are part of buyer qualification. |








